The Log-logistic Regression Model with a Threshold Stress

Cynthia Arantes Vieira Tojeiro, Francisco Louzada Neto

Abstract


- Abstract: In this paper we propose an accelerated lifetime test model with threshold stress under a Log-logistic distribution to express the behavior of lifetimes and a general stress-response relationship. We present a sampling-based inference procedure of the model based on Markov Chain Monte Carlo techniques. We assume proper but vague priors for the parameters of interest. The methodology is illustrated on an artificial and real lifetime data set.

References


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DOI: https://doi.org/10.5540/tema.2011.012.01.0067

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Trends in Computational and Applied Mathematics

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